![](/img/cover-not-exists.png)
[IEEE 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Lausanne, Switzerland (2017.3.27-2017.3.31)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 - COVERT: Counter OVErflow ReducTion for efficient encryption of non-volatlle memories
Swami, Shivam, Mohanram, KartikYear:
2017
Language:
english
DOI:
10.23919/DATE.2017.7927117
File:
PDF, 162 KB
english, 2017