Energetic Mapping of Oxide Traps in MoS2 Field-Effect...

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2D Materials 2017 / 05

Energetic Mapping of Oxide Traps in MoS2 Field-Effect Transistors

Illarionov, Yury, Knobloch, Theresia, Waltl, Michael, Rzepa, Gerhard, Posphischil, Andreas, Polyushkin, Dmitry, Furchi, Marco, Mueller, Thomas, Grasser, Tibor
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Language:
english
Journal:
2D Materials
DOI:
10.1088/2053-1583/aa734a
Date:
May, 2017
File:
PDF, 2.50 MB
english, 2017
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