![](/img/cover-not-exists.png)
[IEEE 2017 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) - Palma de Mallorca, Spain (2017.4.4-2017.4.6)] 2017 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) - Using transition fault test patterns for cost effective offline performance estimation
Zandrahimi, Mahroo, Debaud, Philippe, Castillejo, Armand, Al-Ars, ZaidYear:
2017
Language:
english
DOI:
10.1109/DTIS.2017.7930174
File:
PDF, 1.18 MB
english, 2017