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IEEE Transactions on Nuclear Science 2017

Register File Criticality and Compiler Optimization Effects on Embedded Microprocessors Reliability

Lins, Filipe, Tambara, Lucas, Lima Kastensmidt, Fernanda, Rech, Paolo
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2017.2705150
File:
PDF, 291 KB
english, 2017
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