[IEEE 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Lausanne, Switzerland (2017.3.27-2017.3.31)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 - A power gating switch box architecture in routing network of SRAM-based FPGAs in dark silicon era
Seifoori, Zeinab, Khaleghi, Behnam, Asadi, HosseinYear:
2017
Language:
english
DOI:
10.23919/DATE.2017.7927201
File:
PDF, 561 KB
english, 2017