A versatile atomic force microscope integrated with a scanning electron microscope
Kreith, J., Strunz, T., Fantner, E. J., Fantner, G. E., Cordill, M. J.Volume:
88
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4983317
Date:
May, 2017
File:
PDF, 12.65 MB
english, 2017