A Quatro-Based 65 nm Flip-Flop Circuit for Soft-Error...

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IEEE Transactions on Nuclear Science 2017

A Quatro-Based 65 nm Flip-Flop Circuit for Soft-Error Resilience

Li, Yuanqing, WANG, Haibin, Liu, Rui, Chen, Li, Nofal, Issam, Shi, Shuting, He, Anlin, guo, gang, Baeg, Sanghyeon, Wen, Shi-Jie, Wong, Richard, Chen, Mo, Wu, Qiong
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2017.2704062
File:
PDF, 1.01 MB
english, 2017
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