[IEEE 2017 IEEE 35th VLSI Test Symposium (VTS) - Las Vegas,...

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[IEEE 2017 IEEE 35th VLSI Test Symposium (VTS) - Las Vegas, NV, USA (2017.4.9-2017.4.12)] 2017 IEEE 35th VLSI Test Symposium (VTS) - Fiscal: Firmware identification using side-channel power analysis

Krishnankutty, Deepak, Robucci, Ryan, Banerjee, Nilanjan, Patel, Chintan
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Year:
2017
Language:
english
DOI:
10.1109/VTS.2017.7928948
File:
PDF, 633 KB
english, 2017
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