[IEEE 2017 IEEE 35th VLSI Test Symposium (VTS) - Las Vegas, NV, USA (2017.4.9-2017.4.12)] 2017 IEEE 35th VLSI Test Symposium (VTS) - Fiscal: Firmware identification using side-channel power analysis
Krishnankutty, Deepak, Robucci, Ryan, Banerjee, Nilanjan, Patel, ChintanYear:
2017
Language:
english
DOI:
10.1109/VTS.2017.7928948
File:
PDF, 633 KB
english, 2017