SPIE Proceedings [SPIE The International Conference on Quality Control by Artificial Vision 2017 - Tokyo, Japan (Sunday 14 May 2017)] Thirteenth International Conference on Quality Control by Artificial Vision 2017 - Mixed features for face detection in thermal image
Nagahara, Hajime, Umeda, Kazunori, Yamashita, Atsushi, Ma, Chao, Trung, Ngo Thanh, Uchiyama, Hideaki, Nagahara, Hajime, Shimada, Atsushi, Taniguchi, Rin-ichiroVolume:
10338
Year:
2017
Language:
english
DOI:
10.1117/12.2266836
File:
PDF, 329 KB
english, 2017