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SPIE Proceedings [SPIE The International Conference on Quality Control by Artificial Vision 2017 - Tokyo, Japan (Sunday 14 May 2017)] Thirteenth International Conference on Quality Control by Artificial Vision 2017 - Evidential multi-class classification from binary classifiers: application to waste sorting quality control from hyperspectral data
Nagahara, Hajime, Umeda, Kazunori, Yamashita, Atsushi, Lachaize, Marie, Le Hégarat-Mascle, Sylvie, Aldea, Emanuel, Maitrot, Aude, Reynaud, RogerVolume:
10338
Year:
2017
Language:
english
DOI:
10.1117/12.2266961
File:
PDF, 501 KB
english, 2017