Study of the voltage drop process for the case of high-power thyristors switched in the impact-ionization mode
Gusev, A. I., Lyubutin, S. K., Rukin, S. N., Tsyranov, S. N.Volume:
51
Language:
english
Journal:
Semiconductors
DOI:
10.1134/S1063782617050098
Date:
May, 2017
File:
PDF, 3.29 MB
english, 2017