Ultrahigh-Temperature Oxidation of 4H-SiC(0001) and an Impact of Cooling Process on SiO2/SiC Interface Properties
Hosoi, Takuji, Nagai, Daisuke, Sometani, Mitsuru, Shimura, Takayoshi, Takei, Manabu, Watanabe, HeijiVolume:
897
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.897.323
Date:
May, 2017
File:
PDF, 655 KB
english, 2017