Quantitative surface characterization of silicon spheres by combined XRF and XPS analysis for the determination of the Avogadro constant
Mueller, Matthias, Beckhoff, Burkhard, Beyer, Edyta, Darlatt, Erik, Fliegauf, Rolf, Ulm, Gerhard, Kolbe, MichaelLanguage:
english
Journal:
Metrologia
DOI:
10.1088/1681-7575/aa73c5
Date:
May, 2017
File:
PDF, 988 KB
english, 2017