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Journal of Computational Electronics 2017 / 5

A technique to incorporate both tensile and compressive channel stress in Ge FinFET architecture

Sinha, Kunal, Chattopadhyay, Sanatan, Gupta, Partha Sarathi, Rahaman, Hafizur
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Language:
english
Journal:
Journal of Computational Electronics
DOI:
10.1007/s10825-017-1003-x
Date:
May, 2017
File:
PDF, 3.44 MB
english, 2017
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