Electrical transport characterization of Al and Sn doped Mg 2 Si thin films
Zhang, Bo, Zheng, Tao, Sun, Ce, Guo, Zaibing, Kim, Moon J., Alshareef, Husam N., Quevedo-Lopez, Manuel, Gnade, Bruce E.Language:
english
Journal:
Journal of Alloys and Compounds
DOI:
10.1016/j.jallcom.2017.05.224
Date:
May, 2017
File:
PDF, 894 KB
english, 2017