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Microelectronic Engineering 2017 / 5

MOSFET degradation dependence on input signal power in a RF power amplifier

Crespo-Yepes, A., Barajas, E., Martin-Martinez, J., Mateo, D., Aragones, X., Rodriguez, R., Nafria, M.
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Language:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2017.05.021
Date:
May, 2017
File:
PDF, 816 KB
english, 2017
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