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Pulsed-voltage atom probe tomography of low conductivity and insulator materials by application of ultrathin metallic coating on nanoscale specimen geometry
Adineh, Vahid R., Marceau, Ross. K.W., Chen, Yu, Si, Kae J., Velkov, Tony, Cheng, Wenlong, Li, Jian, Fu, JingLanguage:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2017.05.002
Date:
May, 2017
File:
PDF, 2.05 MB
english, 2017