[IEEE 2017 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) - Palma de Mallorca, Spain (2017.4.4-2017.4.6)] 2017 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) - An effective fault-injection framework for memory reliability enhancement perspectives
Harcha, G., Bosio, A., Girard, P., Virazel, A., Bernardi, P.Year:
2017
Language:
english
DOI:
10.1109/DTIS.2017.7930172
File:
PDF, 2.27 MB
english, 2017