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[IEEE 2017 IEEE 35th VLSI Test Symposium (VTS) - Las Vegas, NV, USA (2017.4.9-2017.4.12)] 2017 IEEE 35th VLSI Test Symposium (VTS) - Fast WAT test structure for measuring Vt variance based on latch-based comparators
Kao-Chi Lee,, Kai-Chiang Wu,, Chih-Ying Tsai,, Chao, Mango Chia-TsoYear:
2017
Language:
english
DOI:
10.1109/VTS.2017.7928928
File:
PDF, 525 KB
english, 2017