Electromigration Reliability With Respect to Cu Weight...

Electromigration Reliability With Respect to Cu Weight Contents of Sn–Ag–Cu Flip-Chip Solder Joints Under Comparatively Low Current Stressing

Lai, Yi-Shao, Chiu, Ying-Ta
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
130
Year:
2008
Language:
english
Journal:
Journal of Electronic Packaging
DOI:
10.1115/1.2957325
File:
PDF, 548 KB
english, 2008
Conversion to is in progress
Conversion to is failed