Morphological and microstructural stability of N-polar...

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 2016 / 03 Vol. 34; Iss. 2

Morphological and microstructural stability of N-polar InAlN thin films grown on free-standing GaN substrates by molecular beam epitaxy

Hardy, Matthew T., McConkie, Thomas O., Smith, David J., Storm, David F., Downey, Brian P., Katzer, D. Scott, Meyer, David J., Nepal, Neeraj
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Volume:
34
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.4940759
Date:
March, 2016
File:
PDF, 2.43 MB
english, 2016
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