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Characterization of interface reaction of Ti/Al-based ohmic contacts on AlGaN/GaN epitaxial layers on GaN substrate
Zadeh, Daryoush H., Tanabe, Shinichi, Watanabe, Noriyuki, Matsuzaki, HideakiVolume:
55
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.55.05FH06
Date:
May, 2016
File:
PDF, 1.57 MB
english, 2016