SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 28 January 2017)] Novel In-Plane Semiconductor Lasers XVI - Direct measurement of the 2D gain profile in a tapered semiconductor laser (Conference Presentation)
Belyanin, Alexey A., Smowton, Peter M., Leisher, Paul O., Swertfeger, Rebecca B., Beil, James A., Misak, Stephen M., Campbell, Jenna, Thomas, Jeremy, Renner, Daniel S., Mashanovitch, Milan L.Volume:
10123
Year:
2017
Language:
english
DOI:
10.1117/12.2253424
File:
PDF, 113 KB
english, 2017