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SPIE Proceedings [SPIE International Conference on Optoelectronics and Microelectronics Technology and Application - Shanghai, China (Monday 10 October 2016)] International Conference on Optoelectronics and Microelectronics Technology and Application - Microscope droplet size detecting based on image processing
Su, Yikai, Xie, Chongjin, Yu, Shaohua, Zhang, Chao, Lu, Wei, Capmany, Jose, Luo, Yi, Nakano, Yoshiaki, Hao, Yue, Yoshikawa, Akihiko, Zhuang, Songlin, Pan, Qi, Zhang, Zijia, Yue, BangshanVolume:
10244
Year:
2017
Language:
english
DOI:
10.1117/12.2260899
File:
PDF, 353 KB
english, 2017