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Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2017 / 5

Electrical characterization of defects induced by electron beam exposure in low doped n -GaAs

Tunhuma, S.M., Auret, F.D., Nel, J.M., Omotoso, E., Danga, H.T., Igumbor, E., Diale, M.
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Language:
english
Journal:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
DOI:
10.1016/j.nimb.2017.05.041
Date:
May, 2017
File:
PDF, 843 KB
english, 2017
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