A combined surface and bulk TCAD damage model for the...

Journal of Instrumentation 2016 / 12 Vol. 11; Iss. 12

A combined surface and bulk TCAD damage model for the analysis of radiation detectors operating at HL-LHC fluences

Morozzi, A., Passeri, D., Moscatelli, F., Betta, G.-F. Dalla, Bilei, G.M.
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Volume:
11
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/11/12/C12028
Date:
December, 2016
File:
PDF, 1.00 MB
english, 2016
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