Calibration-free quantitative analysis of thin-film oxide...

  • Main
  • 2017
  • Calibration-free quantitative analysis of thin-film oxide...

Calibration-free quantitative analysis of thin-film oxide layers in semiconductors using Laser Induced Breakdown Spectroscopy (LIBS).

Davari, Seyyed Ali, Hu, Sheng, Pamu, Ravi, Mukherjee, Dibyendu
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2017
Language:
english
Journal:
J. Anal. At. Spectrom.
DOI:
10.1039/c7ja00083a
File:
PDF, 2.41 MB
english, 2017
Conversion to is in progress
Conversion to is failed