[IEEE 2017 IEEE Applied Power Electronics Conference and Exposition (APEC) - Tampa, FL, USA (2017.3.26-2017.3.30)] 2017 IEEE Applied Power Electronics Conference and Exposition (APEC) - A physically based scalable SPICE model for silicon carbide power MOSFETs
He, Canzhong, Victory, James, Yazdi, Mehrdad Baghaie, Lee, Kwangwon, Domeij, Martin, Allerstam, Fredrik, Neyer, ThomasYear:
2017
Language:
english
DOI:
10.1109/APEC.2017.7931077
File:
PDF, 3.53 MB
english, 2017