SPIE Proceedings [SPIE SPIE Optics + Photonics - San Diego, California, USA (Sunday 13 August 2006)] Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II - Use of design of experiments techniques to investigate resistance change of chip resistors in MESSENGER
Uy, Manny, Uy, O. Manuel, Straka, Sharon A., Hardesty, Jr., Ronald, Fogle, Johnny, Fleming, John C., Dittman, Michael G., Moor, AndrewVolume:
6291
Year:
2006
Language:
english
DOI:
10.1117/12.678542
File:
PDF, 745 KB
english, 2006