Physical Characterisation of 3C-SiC(001)/SiO2 Interface...

Materials Science Forum 2017 / 5 Vol. 897

Physical Characterisation of 3C-SiC(001)/SiO2 Interface Using XPS

Li, Fan, Vavasour, Oliver, Walker, Marc, Martin, David M., Sharma, Yogesh K., Russell, Stephen A.O., Jennings, Michael R., Pérez-Tomás, Amador, Mawby, Philip A.
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Volume:
897
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.897.151
Date:
May, 2017
File:
PDF, 813 KB
english, 2017
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