Ion beam production with sub-milligram samples of material from an ECR source for AMS
Scott, R., Bauder, W., Palchan-Hazan, T., Pardo, R., Vondrasek, R.Volume:
87
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4935001
Date:
February, 2016
File:
PDF, 723 KB
english, 2016