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[IEEE 2017 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - St. Petersburg and Moscow, Russia (2017.2.1-2017.2.3)] 2017 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - Integration of scanning near field polarization optical microscopy and atomic force microscopy for investigation of magnetic and ferroelectric materials
Vysokikh, Yury, Shevyakov, Vasiliy, Shaposhnikov, Alexandr, Prokopov, Anatoliy, Shelaev, ArtemYear:
2017
Language:
english
DOI:
10.1109/EIConRus.2017.7910843
File:
PDF, 421 KB
english, 2017