Measurement Uncertainty Propagation in Transistor Model...

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IEEE Microwave and Wireless Components Letters 2017

Measurement Uncertainty Propagation in Transistor Model Parameters via Polynomial Chaos Expansion

Petrocchi, Alessandra, Kaintura, Arun, Avolio, Gustavo, Spina, Domenico, Dhaene, Tom, Raffo, Antonio, Schreurs, Dominique M. M.-P.
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Year:
2017
Language:
english
Journal:
IEEE Microwave and Wireless Components Letters
DOI:
10.1109/LMWC.2017.2701334
File:
PDF, 590 KB
english, 2017
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