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[IEEE 2016 4th International Conference on Control Engineering & Information Technology (CEIT) - Hammamet, Tunisia (2016.12.16-2016.12.18)] 2016 4th International Conference on Control Engineering & Information Technology (CEIT) - Enhancement and assessment of WKS variance parameter for intelligent 3D shape recognition and matching based on MPSO
Naffouti, Seif Eddine, Aouissaoui, Ichraf, Fougerolle, Yohan, Sakly, Anis, Meriaudeau, FabriceYear:
2016
Language:
english
DOI:
10.1109/CEIT.2016.7929021
File:
PDF, 1.49 MB
english, 2016