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[IEEE 2016 Photonics North (PN) - Quebec City, QC, Canada (2016.5.24-2016.5.26)] 2016 Photonics North (PN) - Optical profilometry based on light microscopy
Belisle, Jonathan M., Dube, Frederic, Blais, Lorraine, Chenard, Daniel, Martel, PatrickYear:
2016
Language:
english
DOI:
10.1109/pn.2016.7537901
File:
PDF, 264 KB
english, 2016