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[IEEE 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Lausanne, Switzerland (2017.3.27-2017.3.31)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 - Improving the accuracy of the leakage power estimation of embedded CPUs
Chin, Ting-Wu, Tsao, Shiao-Li, Hung, Kuo-Wei, Huang, Pei-ShuYear:
2017
Language:
english
DOI:
10.23919/DATE.2017.7927177
File:
PDF, 522 KB
english, 2017