Total dose responses and reliability issues of 65 nm...

Journal of Semiconductors 2016 / 06 Vol. 37; Iss. 6

Total dose responses and reliability issues of 65 nm NMOSFETs

Dezhao, Yu, Qiwen, Zheng, Jiangwei, Cui, Hang, Zhou, Xuefeng, Yu, Qi, Guo
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
37
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/37/6/064016
Date:
June, 2016
File:
PDF, 1.07 MB
english, 2016
Conversion to is in progress
Conversion to is failed