New Data Analysis Tools for X-ray Photoelectron Spectroscopy (XPS) and Spectroscopic Ellipsometry (SE): Uniqueness Plots and Width Functions in XPS, and Distance, Principal Component, and Cluster Analyses in SE
Linford, Matthew R., Singh, Bhupinder, Velázquez, Daniel, Terry, Jeff, Bagley, Jacob D., Tolley, Dennis H., Diwan, Anubhav, Jain, Varun, Herrera-Gomez, AlbertoVolume:
22
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927616002579
Date:
July, 2016
File:
PDF, 200 KB
english, 2016