Ultrafast electron microscopy integrated with a direct electron detection camera
Lee, Young Min, Kim, Young Jae, Kim, Ye-Jin, Kwon, Oh-HoonVolume:
4
Language:
english
Journal:
Structural Dynamics
DOI:
10.1063/1.4983226
Date:
July, 2017
File:
PDF, 1.14 MB
english, 2017