[IEEE 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Dresden, Germany (2017.4.19-2017.4.21)] 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Novel metrics for Analog Mixed-Signal coverage
Furtig, Andreas, Glaser, Georg, Grimm, Christoph, Hedrich, Lars, Heinen, Stefan, Lee, Hyun-Sek Lukas, Nitsche, Gregor, Olbrich, Markus, Radojicic, Carna, Speicher, FabianYear:
2017
Language:
english
DOI:
10.1109/DDECS.2017.7934589
File:
PDF, 1.02 MB
english, 2017