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[IEEE 2017 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - St. Petersburg and Moscow, Russia (2017.2.1-2017.2.3)] 2017 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - Hardware-software system for automation of characteristics measurement of SOI CMOS VLSI elements under extreme high temperature conditions (up to 300°C)
Ismail-zade, Mamed R., Romanov, Aleksandr Y., Kuzin, Egor Y., Danykin, Vladimir S., Chetverikov, Igor A.Year:
2017
Language:
english
DOI:
10.1109/EIConRus.2017.7910582
File:
PDF, 570 KB
english, 2017