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Impact of Series Resistance on Bulk CMOS Current Matching over The 5–300K Temperature Range
Dao, Nguyen Cong, El Kass, Abdallah, Jin, Craig T., Leong, Philip H. W.Year:
2017
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2017.2709545
File:
PDF, 346 KB
english, 2017