Advanced scanning paths for focused ion beam milling
Yoon, Hae-Sung, Kim, Chung-Soo, Lee, Hyun-Taek, Ahn, Sung-HoonVolume:
143
Language:
english
Journal:
Vacuum
DOI:
10.1016/j.vacuum.2017.05.023
Date:
September, 2017
File:
PDF, 14.41 MB
english, 2017