[IEEE 2017 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - St. Petersburg and Moscow, Russia (2017.2.1-2017.2.3)] 2017 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - Development of methods to identify risks to build up the automated diagnosis systems
Veselkov, Viacheslav, Vikhrov, Nikolai, Nyrkov, Anatolii, Chernyi, Sergei, Titov, IvanYear:
2017
Language:
english
DOI:
10.1109/EIConRus.2017.7910625
File:
PDF, 201 KB
english, 2017