SIFTing through Scales

IEEE Transactions on Pattern Analysis and Machine Intelligence 2016

SIFTing through Scales

Hassner, Tal, Filosof, Shay, Mayzels, Viki, Zelnik-Manor, Lihi
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Year:
2016
Language:
english
Journal:
IEEE Transactions on Pattern Analysis and Machine Intelligence
DOI:
10.1109/tpami.2016.2592916
File:
PDF, 6.25 MB
english, 2016
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