SPIE Proceedings [SPIE SPIE LASE - San Francisco, California, United States (Saturday 28 January 2017)] High-Power Laser Materials Processing: Applications, Diagnostics, and Systems VI - Inline measurement for quality control from macro to micro laser applications (Conference Presentation)
Kaierle, Stefan, Heinemann, Stefan W., Kogel-Hollacher, Markus, Schoenleber, Martin, Schulze, Jochen, Bautze, Thibault, Strebel, Matthias, Moser, RüdigerVolume:
10097
Year:
2017
Language:
english
DOI:
10.1117/12.2249676
File:
PDF, 116 KB
english, 2017