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SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 24 April 2017)] EUV and X-ray Optics: Synergy between Laboratory and Space V - A table top polarimetric facility for the EUV spectral range: implementations and characterization
Hudec, René, Pina, Ladislav, Gaballah, A. E. H., Zuppella, P., Ahmed, Nadeem, Jimenez, K., Pettinari, G., Gerardino, A., Nicolosi, P.Volume:
10235
Year:
2017
Language:
english
DOI:
10.1117/12.2265592
File:
PDF, 549 KB
english, 2017