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[IEEE 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Dresden, Germany (2017.4.19-2017.4.21)] 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - An analysis of the operation and SET robustness of a CMOS pulse stretching circuit
Andjelkovic, Marko, Krstic, Milos, Kraemer, RolfYear:
2017
Language:
english
DOI:
10.1109/DDECS.2017.7934590
File:
PDF, 365 KB
english, 2017