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[IEEE 2016 29th IEEE International System-on-Chip Conference (SOCC) - Seattle, WA, USA (2016.9.6-2016.9.9)] 2016 29th IEEE International System-on-Chip Conference (SOCC) - A method to estimate effectiveness of weak bit test: Comparison of weak pMOS and WL boost based test - 28nm FDSOI implementation
Batra, Nidhi, Kaushik, Shashwat, Gundu, Anil Kumar, Hashmi, Mohammad S., Visweswaran, G.S., Grover, AnujYear:
2016
Language:
english
DOI:
10.1109/SOCC.2016.7905432
File:
PDF, 717 KB
english, 2016