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[Society for Industrial and Applied Mathematics Proceedings of the Twenty-Eighth Annual ACM-SIAM Symposium on Discrete Algorithms - ()] Proceedings of the Twenty-Eighth Annual ACM-SIAM Symposium on Discrete Algorithms - Sequential measurements, disturbance and property testing
Harrow, Aram W., Lin, Cedric Yen-Yu, Montanaro, AshleyLanguage:
english
DOI:
10.1137/1.9781611974782.105
File:
PDF, 444 KB
english